A Model-based Approach to Extract Leaf Features from 3D Scans

Franz Uhrmann Fraunhofer Institute for Integrated Circuits IIS
Christian Hügel Fraunhofer Institute for Integrated Circuits IIS
Sabine Paris Fraunhofer Institute for Integrated Circuits IIS
Oliver Scholz Fraunhofer Institute for Integrated Circuits IIS
Michael Zollhöfer Computer Graphics Group, University Erlangen-Nuremberg
Günther Greiner Computer Graphics Group, University Erlangen-Nuremberg

Keywords: phenotyping, leaf model, vitality monitoring

Abstract

We present a flexible and robust method for the extraction of leaf features from 3D point clouds. An adaptable leaf model is automatically fitted to the measured data in order to obtain a precise but compact parameterization of the leaf shape. As an application example the detection of stress using the fitted leaf parameters is demonstrated.

Published

2013-06-03

Issue

FSPM2013

Section

1B Reconstructing and observing plant structure

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