Inference of structural plant growth from discrete samples

Christoph Stocker Fraunhofer Institute for Integrated Circuits, Department Contactless Test and Measuring Systems
Franz Uhrmann Fraunhofer Institute for Integrated Circuits, Department Contactless Test and Measuring Systems
Oliver Scholz Fraunhofer Institute for Integrated Circuits, Department Contactless Test and Measuring Systems

Keywords: grammar inference, L-systems, plant growth modeling

Abstract

We present an approach for the rapid generation of plant growth models from a series of explicit growth stages. Multiple structural plant descriptions, which can be gained from 3D scans, are automatically inferred to an L-system grammar. Morphological leaf features are incorporated into this model by parameterization of the structural description.

Published

2013-06-03

Issue

FSPM2013

Section

1B Reconstructing and observing plant structure

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