Monitoring the diel growth of individual Arabidopsis leaves using a laser scanning approach
Keywords:
Arabidopsis, phenotyping, leaf growth, laser scanning
Abstract
A novel phenotyping approach is presented to monitor diel variation in elongation and elevation angle of individual leaves with high precision and throughput. Leaf elongation and changes in leaf elevation angle follow characteristic diel rhythms and show an overall decrease with increasing leaf age.
Published
2013-06-03
Issue
Section
1B Reconstructing and observing plant structure
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